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Proceedings Paper

Modeling Fizeau interferometer based on ray tracing with Zemax
Author(s): Yiwei He; Xi Hou; Yongqian Wu; Fan Wu; Haiyang Quan; Fengwei Liu
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Paper Abstract

A convenient method to study the influence of error sources in Fizeau is to build a ray-tracing model to simulate the error sources. In this paper an interferometer model is presented; an extension program is called to simulate the interference; and a preliminary research of several error sources is conducted. These examples demonstrate error analysis based on interferometer models is feasible and provide some guidance for optimizing our interferometer design.

Paper Details

Date Published: 8 October 2015
PDF: 8 pages
Proc. SPIE 9677, AOPC 2015: Optical Test, Measurement, and Equipment, 96770G (8 October 2015); doi: 10.1117/12.2197612
Show Author Affiliations
Yiwei He, Institute of Optics and Electronics (China)
Univ. of Chinese Academy of Sciences (China)
Xi Hou, Institute of Optics and Electronics (China)
Yongqian Wu, Institute of Optics and Electronics (China)
Fan Wu, Institute of Optics and Electronics (China)
Haiyang Quan, Institute of Optics and Electronics (China)
Fengwei Liu, Institute of Optics and Electronics (China)


Published in SPIE Proceedings Vol. 9677:
AOPC 2015: Optical Test, Measurement, and Equipment
Sen Han; Jonathan D. Ellis; Junpeng Guo; Yongcai Guo, Editor(s)

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