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Proceedings Paper

Depth determination of critical fluence-limiting defects within planarized and non-planarized mirror coatings
Author(s): Christopher J. Stolz; Justin E. Wolfe; Paul B. Mirkarimi; James A. Folta; John J. Adams; Marlon G. Menor; Rajesh Raman; Norm Neilsen; Mary Norton; Ronald Luthi; Nick E. Teslich; Carmen S. Menoni; Dinesh Patel
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Paper Abstract

Multilayer interference optical mirror coatings are traditionally fluence-limited by nodular inclusions. Planarization of these defects modifies the geometrically and interference-induced light intensification to increase the laser resistance of mirror coatings. Previous studies using engineered defects on the substrate or buried in the middle of the coating stack have focused only on understanding the improvement in laser resistance. However, real coating defects are distributed throughout the coating. To better understand differences between the critical fluence-limiting defects of both planarized and non-planarized mirror coatings, laser damage pit depths were determined as a function of laser fluence.

Paper Details

Date Published: 23 September 2015
PDF: 5 pages
Proc. SPIE 9627, Optical Systems Design 2015: Advances in Optical Thin Films V, 96271C (23 September 2015); doi: 10.1117/12.2197349
Show Author Affiliations
Christopher J. Stolz, Lawrence Livermore National Lab. (United States)
Justin E. Wolfe, Lawrence Livermore National Lab. (United States)
Paul B. Mirkarimi, Lawrence Livermore National Lab. (United States)
James A. Folta, Lawrence Livermore National Lab. (United States)
John J. Adams, Lawrence Livermore National Lab. (United States)
Marlon G. Menor, Lawrence Livermore National Lab. (United States)
Rajesh Raman, Lawrence Livermore National Lab. (United States)
Norm Neilsen, Lawrence Livermore National Lab. (United States)
Mary Norton, Lawrence Livermore National Lab. (United States)
Ronald Luthi, Lawrence Livermore National Lab. (United States)
Nick E. Teslich, Lawrence Livermore National Lab. (United States)
Carmen S. Menoni, Colorado State Univ. (United States)
Dinesh Patel, Colorado State Univ. (United States)


Published in SPIE Proceedings Vol. 9627:
Optical Systems Design 2015: Advances in Optical Thin Films V
Michel Lequime; H. Angus Macleod; Detlev Ristau, Editor(s)

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