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Proceedings Paper

Research of IRFPAs' reliability evaluation by bad pixel
Author(s): Lichao Hao; Aibo Huang; Canxiong Lai; Xing Chen; Mingming Hao; Honglei Chen; Guoguang Lu; Yun Huang; Yunfei En
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Paper Abstract

Reliability is an important index to ensure the application of infrared focal plane arrays (IRFPAs) in complex environment, and it becomes a major bottleneck problem of IRFPAs’ development. Because of the characteristics such as type, nature, quantity, location and distribution et al, bad pixel which contains initial bad pixel and used bad pixel has outstanding advantage for failure analysis and reliability evaluation of IRFPAs. In this paper, the structure of IRPFAs has been introduced in detail, and the damage mechanisms of used bad pixel also have been analyzed deeply. At the same time, the feasibility to study IRPFAs' damage stress, failure position, damage mechanism has been discussed all around. The research of bad pixel can be used to optimize the structure and process, meanwhile it also can improve the accuracy of bad pixel identification and replacements.

Paper Details

Date Published: 15 October 2015
PDF: 6 pages
Proc. SPIE 9674, AOPC 2015: Optical and Optoelectronic Sensing and Imaging Technology, 96740H (15 October 2015); doi: 10.1117/12.2197321
Show Author Affiliations
Lichao Hao, China Electronic Product Reliability and Environmental Testing Research Institute (China)
Aibo Huang, Shanghai Institute of Technical Physics (China)
Canxiong Lai, China Electronic Product Reliability and Environmental Testing Research Institute (China)
Xing Chen, Shanghai Institute of Technical Physics (China)
Mingming Hao, China Electronic Product Reliability and Environmental Testing Research Institute (China)
Honglei Chen, Shanghai Institute of Technical Physics (China)
Guoguang Lu, China Electronic Product Reliability and Environmental Testing Research Institute (China)
Yun Huang, China Electronic Product Reliability and Environmental Testing Research Institute (China)
Yunfei En, China Electronic Product Reliability and Environmental Testing Research Institute (China)


Published in SPIE Proceedings Vol. 9674:
AOPC 2015: Optical and Optoelectronic Sensing and Imaging Technology
Haimei Gong; Nanjian Wu; Yang Ni; Weibiao Chen; Jin Lu, Editor(s)

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