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Proceedings Paper

A new x-ray framing camera with picoseconds time resolution
Author(s): Yongsheng Gou; Yonglin Bai; Baiyu Liu; Xiaohong Bai; Junjun Qin; Bo Wang; Bingli Zhu; Xu Peng; Weiwei Cao
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Paper Abstract

A new method to get a X-ray framing camera with picoseconds time resolution was proposed based on time amplification. Its principle comes from that we use high voltage electrical pulse to get speed dispersion of the photoelectrons pulse first, and then the photoelectrons pulse will be stretched in axial direction by drift area, at the end the photoelectrons pulse after stretched will be framing imaged by a traditional MCP(microchannel plate)gated framing camera. A model of the camera was built according to this method. Time amplification of the system is about 30, and image magnification of the system is about 0.4. Parameters for designing the camera system were presented after theoretical deriving and model simulation. At last, theoretical time resolution and spatial resolution of the camera were given.

Paper Details

Date Published: 15 October 2015
PDF: 5 pages
Proc. SPIE 9674, AOPC 2015: Optical and Optoelectronic Sensing and Imaging Technology, 96740G (15 October 2015); doi: 10.1117/12.2197312
Show Author Affiliations
Yongsheng Gou, Xi'an Institute of Optics and Precision Mechanics (China)
Graduate School of the Chinese Academy of Sciences (China)
Yonglin Bai, Xi'an Institute of Optics and Precision Mechanics (China)
Baiyu Liu, Xi'an Institute of Optics and Precision Mechanics (China)
Xiaohong Bai, Xi'an Institute of Optics and Precision Mechanics (China)
Junjun Qin, Xi'an Institute of Optics and Precision Mechanics (China)
Bo Wang, Xi'an Institute of Optics and Precision Mechanics (China)
Bingli Zhu, Xi'an Institute of Optics and Precision Mechanics (China)
Xu Peng, Xi'an Institute of Optics and Precision Mechanics (China)
Weiwei Cao, Xi'an Institute of Optics and Precision Mechanics (China)


Published in SPIE Proceedings Vol. 9674:
AOPC 2015: Optical and Optoelectronic Sensing and Imaging Technology
Haimei Gong; Nanjian Wu; Yang Ni; Weibiao Chen; Jin Lu, Editor(s)

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