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Proceedings Paper

A new, fast and accurate spectrophotometric method for the determination of the optical constants of arbitrary absorptance thin films from a single transmittance curve: application to dielectric materials
Author(s): Jean Desforges; Clément Deschamps; Serge Gauvin
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Paper Abstract

The determination of the complex refractive index of thin films usually requires the highest accuracy. In this paper, we report on a new and accurate method based on a spectral rectifying process of a single transmittance curve. The agreements with simulated and real experimental data show the helpfulness of the method. The case of materials having arbitrary absorption bands at midpoint in spectral range, such as pigments in guest-host polymers, is also encompassed by this method.

Paper Details

Date Published: 20 August 2015
PDF: 7 pages
Proc. SPIE 9558, Nanostructured Thin Films VIII, 95580F (20 August 2015); doi: 10.1117/12.2197139
Show Author Affiliations
Jean Desforges, Univ. de Moncton (Canada)
Clément Deschamps, Univ. de Poitiers (France)
Serge Gauvin, Univ. de Moncton (Canada)


Published in SPIE Proceedings Vol. 9558:
Nanostructured Thin Films VIII
Akhlesh Lakhtakia; Tom G. Mackay; Motofumi Suzuki, Editor(s)

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