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Proceedings Paper

Exploration of mXRF analysis of gunshot residue from cartridge cases
Author(s): Martin Janssen; Amalia Stamouli; Alwin Knijnenberg
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Paper Abstract

During the reconstruction of a shooting incident, several analytical techniques are at the disposal of forensic scientists. The Netherlands Forensic Institute is exploring the opportunities in which mXRF can be used to obtain information in these reconstructions. In this paper the possibilities of using the 2D-mXRF instrument as a screening tool are explored. Primarily the focus is on using mXRF to obtain information regarding the elemental composition of gunshot residue from cartridge cases. Secondly, the possibilities of using the 2D-mXRF instrument to, quickly and easily, set up databases for gunshot residue analysis are investigated.

Paper Details

Date Published: 21 October 2015
PDF: 8 pages
Proc. SPIE 9636, Scanning Microscopies 2015, 96360I (21 October 2015); doi: 10.1117/12.2197028
Show Author Affiliations
Martin Janssen, Netherlands Forensic Institute (Netherlands)
Amalia Stamouli, Netherlands Forensic Institute (Netherlands)
Alwin Knijnenberg, Netherlands Forensic Institute (Netherlands)

Published in SPIE Proceedings Vol. 9636:
Scanning Microscopies 2015
Michael T. Postek; Dale E. Newbury; S. Frank Platek; Tim K. Maugel, Editor(s)

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