Share Email Print
cover

Proceedings Paper

A compilation of cold cases using scanning electron microscopy at the University of Rhode Island
Author(s): Michael J. Platek; Otto J. Gregory
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Scanning electron microscopy combined with microchemical analysis has evolved into one of the most widely used instruments in forensic science today. In particular, the environmental scanning electron microscope (SEM) in conjunction with energy dispersive spectroscopy (EDS), has created unique opportunities in forensic science in regard to the examination of trace evidence; i.e. the examination of evidence without altering the evidence with conductive coatings, thereby enabling criminalists to solve cases that were previously considered unsolvable. Two cold cases were solved at URI using a JEOL 5900 LV SEM in conjunction with EDS. A cold case murder and a cold missing person case will be presented from the viewpoint of the microscopist and will include sample preparation, as well as image and chemical analysis of the trace evidence using electron microscopy and optical microscopy.

Paper Details

Date Published: 21 October 2015
PDF: 6 pages
Proc. SPIE 9636, Scanning Microscopies 2015, 96360F (21 October 2015); doi: 10.1117/12.2196968
Show Author Affiliations
Michael J. Platek, The Univ. of Rhode Island (United States)
Otto J. Gregory, The Univ. of Rhode Island (United States)


Published in SPIE Proceedings Vol. 9636:
Scanning Microscopies 2015
Michael T. Postek; Dale E. Newbury; S. Frank Platek; Tim K. Maugel, Editor(s)

© SPIE. Terms of Use
Back to Top