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Proceedings Paper

Measurement and analysis of sky background spectra in passive ranging
Author(s): Zhang Yu; Bingqi Liu; Hao Yu; Xiaoming Li; Zongqun Yan; Wenshen Hua; Yunsheng Shi; Yichao Chen
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Paper Abstract

Experimental program is designed to analyze the radiation and absorption characteristic of the sky background at near-infrared Oxygen A absorption band of passive ranging based on Oxygen spectral absorption; an acousto-optic tunable hyper spectral imaging spectrometer is used as the measuring device. Under the condition of sunny, cloudy, and snowy weather, the sky background spectral distribution is collected using the acousto-optic tunable hyper spectral imaging spectrometer. Then the Oxygen absorption rate is calculated according to the principle of Oxygen spectrum absorption passive ranging. The measurement result shows: absorption lines exist in the sky background spectral distribution at the Oxygen A absorption band, and the absorption rates are different at different weather conditions. The Oxygen absorption rates are the biggest under snowy weather, bigger under cloudy weather, and the smallest under sunny weather. The general change pattern of Oxygen absorption rate under different weather conditions is obtained and the result has laid solid foundation for suppressing the interference of the background and extracting target spectral accurately in subsequent passive ranging researching.

Paper Details

Date Published: 8 October 2015
PDF: 5 pages
Proc. SPIE 9677, AOPC 2015: Optical Test, Measurement, and Equipment, 967709 (8 October 2015); doi: 10.1117/12.2196928
Show Author Affiliations
Zhang Yu, Mechanical Engineering College (China)
Bingqi Liu, Mechanical Engineering College (China)
Hao Yu, Mechanical Engineering College (China)
Xiaoming Li, Mechanical Engineering College (China)
Zongqun Yan, Mechanical Engineering College (China)
Wenshen Hua, Mechanical Engineering College (China)
Yunsheng Shi, Mechanical Engineering College (China)
Yichao Chen, Mechanical Engineering College (China)


Published in SPIE Proceedings Vol. 9677:
AOPC 2015: Optical Test, Measurement, and Equipment
Sen Han; Jonathan D. Ellis; Junpeng Guo; Yongcai Guo, Editor(s)

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