Share Email Print
cover

Proceedings Paper

A light down conversion infrared scene projector
Author(s): Yang Yang; Shi Nuo; Lang Zhou; Chang Xu; Hongjie Wang; Li Zhang; Yanhong Li; Zhuo Li
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

An infrared scene projector is described in this paper which based on light down conversion. The film transducer is the key device of the projector which is a free standing substrate and coated on one side with an absorbing optical black. The optical black coating absorbs the visible light and emits the infrared light. The emission spectrum is similar with the blackbody. The single pixel which is 25×25μm in sizes and 35um at intervals in a film transducer is realized by MEMS technology. The array size of the film transducer is more than 1024×1024 in a transducer of 76.2mm (3 inch) diameter. Illuminated by a visible light projector with different intensities, the gray scale is more than 200 and the equivalent black body temperature of the transducer could be varied in the range of 293K to 573K.

Paper Details

Date Published: 8 October 2015
PDF: 6 pages
Proc. SPIE 9677, AOPC 2015: Optical Test, Measurement, and Equipment, 967708 (8 October 2015); doi: 10.1117/12.2196921
Show Author Affiliations
Yang Yang, Beijing Institute of Technology (China)
Beijing Key Lab. of Precision Optoelectronic Measurement Instrument and Technology (China)
Shanghai Institute of Electro-mechanical Engineering (China)
Shi Nuo, Beijing Institute of Technology (China)
Beijing Key Lab. of Precision Optoelectronic Measurement Instrument and Technology (China)
Lang Zhou, Beijing Institute of Technology (China)
Beijing Key Lab. of Precision Optoelectronic Measurement Instrument and Technology (China)
Chang Xu, Beijing Institute of Technology (China)
Beijing Key Lab. of Precision Optoelectronic Measurement Instrument and Technology (China)
Hongjie Wang, Beijing Institute of Technology (China)
Beijing Key Lab. of Precision Optoelectronic Measurement Instrument and Technology (China)
Li Zhang, Shanghai Institute of Electro-mechanical Engineering (China)
Yanhong Li, Shanghai Institute of Electro-mechanical Engineering (China)
Zhuo Li, Beijing Institute of Technology (China)
Beijing Key Lab. of Precision Optoelectronic Measurement Instrument and Technology (China)


Published in SPIE Proceedings Vol. 9677:
AOPC 2015: Optical Test, Measurement, and Equipment
Sen Han; Jonathan D. Ellis; Junpeng Guo; Yongcai Guo, Editor(s)

© SPIE. Terms of Use
Back to Top