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Proceedings Paper

Surface enhanced Raman scattering activity of TiN thin film prepared via nitridation of sol-gel derived TiO2 film
Author(s): Zhanliang Dong; Hengyong Wei; Ying Chen; Ruisheng Wang; Junhong Zhao; Jian Lin; Jinglong Bu; Yingna Wei; Yi Cui; Yun Yu
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Paper Abstract

Surface-enhanced Raman scattering (SERS) is a powerful and non-destructive analytical technique tool for chemical and biological sensing applications. Metal-free SERS substrates have recently been developed by using semiconductor nanostructures. The optical property of TiN film is similar to that of gold. Besides that, its good chemical inertness and thermodynamic stability make TiN thin film an excellent candidate for SERS. In order to investigate its SERS activity, the TiN thin film was successfully prepared via direct nitridation of the sol-gel derived TiO2 thin film on the quartz substrate using ammonia gas as reducing agent. The crystallite structures and morphology of TiN thin film were determined by XRD, RAMAN and FE-SEM. The results show that the thin film obtained is cubic titanium nitride with a lattice parameter of 4.2349 Å. The surface of TiN thin film is rough and with the particles of 50 nm in average sizes. The thickness of TiN thin film is about 130 nm. The TiN thin film displays a surface Plasmon resonance absorption peak at around 476 nm, which can lead to a strong enhancement of the EM field on the interface. The Raman signal of the probe molecule R6G was greatly enhanced through TiN thin film substrates. The enhancement factor is about 4.1×103 and the detection limit achieves 10-6 M for R6G. The TiN thin film substrate also shows a good reproducibility of SERS performance. The results indicate that TiN thin film is an attractive material with potential application in SERS substrates.

Paper Details

Date Published: 15 October 2015
PDF: 6 pages
Proc. SPIE 9672, AOPC 2015: Advanced Display Technology; and Micro/Nano Optical Imaging Technologies and Applications, 967209 (15 October 2015); doi: 10.1117/12.2196788
Show Author Affiliations
Zhanliang Dong, Hebei United Univ. (China)
Hengyong Wei, Hebei United Univ. (China)
Tongji Univ. (China)
Key Lab. of Inorganic Coating Materials (China)
Ying Chen, Hebei United Univ. (China)
Ruisheng Wang, Hebei United Univ. (China)
Junhong Zhao, Tongji Univ. (China)
Jian Lin, Tongji Univ. (China)
Jinglong Bu, Hebei United Univ. (China)
Yingna Wei, Hebei United Univ. (China)
Yi Cui, Hebei United Univ. (China)
Yun Yu, Key Lab. of Inorganic Coating Materials (China)


Published in SPIE Proceedings Vol. 9672:
AOPC 2015: Advanced Display Technology; and Micro/Nano Optical Imaging Technologies and Applications
Byoungho Lee; Yikai Su; Min Gu; Xiaocong Yuan; Daniel Jaque, Editor(s)

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