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Proceedings Paper

Using near infrared light for deep sea mining observation systems
Author(s): Huimin Lu; Yujie Li; Xin Li; Jianmin Yang; Seiichi Serikawa
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Paper Abstract

In this paper, we design a novel deep-sea near infrared light based imaging equipment for deep-sea mining observation systems. The spectral sensitivity peaks are in the red region of the invisible spectrum, ranging from 750nm to 900nm. In addition, we propose a novel underwater imaging model that compensates for the attenuation discrepancy along the propagation path. The proposed model fully considered the effects of absorption, scattering and refraction. We also develop a locally adaptive Laplacian filtering for enhancing underwater transmission map after underwater dark channel prior estimation. Furthermore, we propose a spectral characteristic-based color correction algorithm to recover the distorted color. In water tank experiments, we made a linear scale of eight turbidity steps ranging from clean to heavily scattered by adding deep sea soil to the seawater (from 500 to 2000 mg/L). We compared the results of different turbidity underwater scene, illuminated alternately with near infrared light vs. white light. Experiments demonstrate that the enhanced NIR images have a reasonable noise level after the illumination compensation in the dark regions and demonstrates an improved global contrast by which the finest details and edges are significantly enhanced. We also demonstrate that the effective distance of the designed imaging system is about 1.5 meters, which can meet the requirement of micro-terrain observation around the deep-sea mining systems. Remotely Operated Underwater Vehicle (ROV)-based experiments also certified the effectiveness of the proposed method.

Paper Details

Date Published: 8 October 2015
PDF: 9 pages
Proc. SPIE 9675, AOPC 2015: Image Processing and Analysis, 967503 (8 October 2015); doi: 10.1117/12.2196779
Show Author Affiliations
Huimin Lu, Kyushu Institute of Technology (Japan)
Tongji Univ. (China)
Shanghai Jiaotong Univ. (China)
Yujie Li, Kyushu Institute of Technology (Japan)
Xin Li, Shanghai Jiaotong Univ. (China)
Jianmin Yang, Shanghai Jiaotong Univ. (China)
Seiichi Serikawa, Kyushu Institute of Technology (Japan)

Published in SPIE Proceedings Vol. 9675:
AOPC 2015: Image Processing and Analysis
Chunhua Shen; Weiping Yang; Honghai Liu, Editor(s)

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