Share Email Print

Proceedings Paper

Using a university characterization facility to educate the public about microscopes: light microscopes to SEM
Author(s): Nancy Healy; Walter Henderson
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The National Nanotechnology Infrastructure Network (NNIN)1is an integrated partnership of 14 universities across the US funded by NSF to support nanoscale researchers. The NNIN education office is located at the Institute of Electronics and Nanotechnology at the Georgia Institute of Technology. At Georgia Tech we offer programs that integrate the facility and its resources to educate the public about nanotechnology. One event that has proved highly successful involves using microscopes in our characterization suite to educate a diverse audience about a variety of imaging instruments. As part of the annual Atlanta Science Festival (ATLSF)2 we provided an event entitled: “What’s all the Buzz about Nanotechnology?” which was open to the public and advertised through a variety of methods by the ATLSF. During the event, we provided hands-on demos, cleanroom tours, and activities with three of our microscopes in our recently opened Imaging and Characterization Facility: 1. Keyence VHX-600 Digital Microscope; 2. Hitachi SU823 FE-SEM; and 3. Hitachi TM 3000. During the two hour event we had approximately 150 visitors including many families with school-aged children. Visitors were invited to bring a sample for scanning with the TM-3000. This paper will discuss how to do such an event, lessons learned, and visitor survey results.

Paper Details

Date Published: 21 October 2015
PDF: 8 pages
Proc. SPIE 9636, Scanning Microscopies 2015, 96360M (21 October 2015); doi: 10.1117/12.2196552
Show Author Affiliations
Nancy Healy, Georgia Institute of Technology (United States)
Walter Henderson, Georgia Institute of Technology (United States)

Published in SPIE Proceedings Vol. 9636:
Scanning Microscopies 2015
Michael T. Postek; Dale E. Newbury; S. Frank Platek; Tim K. Maugel, Editor(s)

© SPIE. Terms of Use
Back to Top