Share Email Print

Proceedings Paper

Instantaneous phase-shifting Fizeau interferometry with high-speed pixelated phase-mask camera
Author(s): Toyohiko Yatagai; Boaz Jessie Jackin; Akira Ono; Kosuke Kiyohara; Masato Noguchi; Minoru Yoshii; Motosuke Kiyohara; Hayato Niwa; Kazuyuki Ikuo; Takashi Onuma
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A Fizeou interferometer with instantaneous phase-shifting ability using a Wollaston prism is designed. to measure dynamic phase change of objects, a high-speed video camera of 10-5s of shutter speed is used with a pixelated phase-mask of 1024 × 1024 elements. The light source used is a laser of wavelength 532 nm which is split into orthogonal polarization states by passing through a Wollaston prism. By adjusting the tilt of the reference surface it is possible to make the reference and object beam with orthogonal polarizations states to coincide and interfere. Then the pixelated phase-mask camera calculate the phase changes and hence the optical path length difference. Vibration of speakers and turbulence of air flow were successfully measured in 7,000 frames/sec.

Paper Details

Date Published: 24 August 2015
PDF: 4 pages
Proc. SPIE 9660, SPECKLE 2015: VI International Conference on Speckle Metrology, 966018 (24 August 2015); doi: 10.1117/12.2196420
Show Author Affiliations
Toyohiko Yatagai, Utsunomiya Univ. (Japan)
Boaz Jessie Jackin, Utsunomiya Univ. (Japan)
Akira Ono, Utsunomiya Univ. (Japan)
Kosuke Kiyohara, Kiyohara Optics Inc. (Japan)
Masato Noguchi, Kiyohara Optics Inc. (Japan)
Minoru Yoshii, Kiyohara Optics Inc. (Japan)
Motosuke Kiyohara, Kiyohara Optics Inc. (Japan)
Hayato Niwa, Photron Ltd. (Japan)
Kazuyuki Ikuo, Photron Ltd. (Japan)
Takashi Onuma, Photron Ltd. (Japan)

Published in SPIE Proceedings Vol. 9660:
SPECKLE 2015: VI International Conference on Speckle Metrology
Fernando Mendoza Santoyo; Eugenio R. Mendez, Editor(s)

© SPIE. Terms of Use
Back to Top