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Proceedings Paper

Temperature measurement of axi- symmetric butane diffusion flame under the influence of upward decreasing gradient magnetic field using digital holographic interferometry
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Paper Abstract

In this paper, digital holographic interferometry (DHI) is implemented to investigate the effect of upward decreasing gradient magnetic field on the temperature and temperature profile of diffusion flame created by butane torch burner. In the experiment double exposure digital holographic interferometry is used to calculate the temperature distribution inside the flame. First a digital hologram is recorded in the absence of flame and second hologram is recorded in the presence of flame. Phases in two different states of air (i.e. in absence of flame and presence of flame) are reconstructed individually by numerical method. The phase difference map is obtained by subtracting the reconstructed phase of air in presence and absence of flame. Refractive index inside the flame is obtained from the axi-symmetric phase difference data using the Abel inversion integral. Temperature distribution inside the flame is calculated from the refractive index data using Lorentz - Lorentz equation. Experiment is conducted on a diffusion flame created by butane torch burner in the absence of magnetic field and in presence of upward decreasing gradient magnetic field. Experimental investigations reveal that the maximum temperature inside the flame increases under the influence of upward decreasing magnetic field.

Paper Details

Date Published: 24 August 2015
PDF: 8 pages
Proc. SPIE 9660, SPECKLE 2015: VI International Conference on Speckle Metrology, 96600I (24 August 2015); doi: 10.1117/12.2196396
Show Author Affiliations
Varun Kumar, Indian Institute of Technology Delhi (India)
Manoj Kumar, Indian Institute of Technology Delhi (India)
Chandra Shakher, Indian Institute of Technology Delhi (India)


Published in SPIE Proceedings Vol. 9660:
SPECKLE 2015: VI International Conference on Speckle Metrology
Fernando Mendoza Santoyo; Eugenio R. Mendez, Editor(s)

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