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Proceedings Paper

Synthetic aperture double exposure digital holographic interferometry for wide angle measurement and monitoring of mechanical displacements
Author(s): M. Kujawinska; P. Makowski; G. Finke; J. Zak; M. Józwik; T. Kozacki
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Paper Abstract

A novel approach for wide angle registration and display of double exposure digital holograms of 3D objects under static or step-wise load is presented. The registration setup concept combines digital Fourier holography with synthetic aperture (SA) technique, which is equivalent to usage of a wide angle, spherically curved detector. The coherent object wavefields extracted from a pair of acquisitions collected in the synthetic aperture double exposure digital holographic interferometry scheme (SA DEDH) are utilized as the input for two different scenarios of investigation, which include (i) numerical determination of 2D phase difference fringes representing deformation of an object and (ii) physical displaying of a 3D image resulting from interference of two object (slightly different) wavefronts registered at the SA double exposure hologram. The capture and display processes are analyzed and implemented. The applicability of both numerical and experimental approach to SA DEDH for testing engineering objects is discussed.

Paper Details

Date Published: 24 August 2015
PDF: 9 pages
Proc. SPIE 9660, SPECKLE 2015: VI International Conference on Speckle Metrology, 966019 (24 August 2015); doi: 10.1117/12.2196138
Show Author Affiliations
M. Kujawinska, Warsaw Univ. of Technology (Poland)
P. Makowski, Warsaw Univ. of Technology (Poland)
G. Finke, Warsaw Univ. of Technology (Poland)
J. Zak, Warsaw Univ. of Technology (Poland)
M. Józwik, Warsaw Univ. of Technology (Poland)
T. Kozacki, Warsaw Univ. of Technology (Poland)

Published in SPIE Proceedings Vol. 9660:
SPECKLE 2015: VI International Conference on Speckle Metrology
Fernando Mendoza Santoyo; Eugenio R. Mendez, Editor(s)

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