Share Email Print
cover

Proceedings Paper

Coma full-field display for freeform imaging systems
Author(s): Aaron Bauer; Kevin P. Thompson; Jannick P. Rolland
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

With the recent advances in optical fabrication technology, the manufacturing of freeform optical surfaces is no longer prohibitive. To spur the development of freeform systems, however, optical designers must be given the necessary tools to efficiently design, analyze, and tolerance these systems. The process for designing freeform imaging systems is enhanced by the knowledge of the individual aberration contributions across the full field-of-view. As shown in the recent aberration theory for freeform surfaces, identifying the field dependence of the dominant aberrations is critical for a controlled freeform optimization. Coma, an often system-limiting aberration and an aberration that has recently been directly addressed with freeform surfaces, is of specific interest. Currently, a coma full-field display (FFD) of a system can be generated in commercial ray-tracing software by fitting the wavefront at the exit pupil with Zernike polynomials, but this process can involve tracing thousands of rays. Moreover, the circular coma FFDs are inherently separate from the elliptical coma FFDs. In this research, we use nodal aberration theory to develop a method to generate a coma FFD that requires only a few (less than 10) rays per field point to be traced through the optical system. Both the magnitude and orientation of the coma aberrations at the image plane are shown in our FFDs, including the effects of elliptical coma. These coma FFDs save computation time during the design and offer valuable insight to the designer. Examples of the plots will be shown for multiple freeform optical systems.

Paper Details

Date Published: 11 October 2015
PDF: 4 pages
Proc. SPIE 9633, Optifab 2015, 963316 (11 October 2015); doi: 10.1117/12.2196061
Show Author Affiliations
Aaron Bauer, The Institute of Optics, Univ. of Rochester (United States)
Kevin P. Thompson, Synopsys, Inc. (United States)
The Institute of Optics, Univ. of Rochester (United States)
Jannick P. Rolland, The Institute of Optics, Univ. of Rochester (United States)


Published in SPIE Proceedings Vol. 9633:
Optifab 2015
Julie L. Bentley; Sebastian Stoebenau, Editor(s)

© SPIE. Terms of Use
Back to Top