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Proceedings Paper

A simple device for sub-aperture stitching of fast convex surfaces
Author(s): D. Aguirre-Aguirre; R. Izazaga-Pérez; B. Villalobos-Mendoza; E. Carrasco-Licea; F. S. Granados-Agustin; M. E. Percino-Zacarías; M. F. Salazar-Morales; E. Cruz-Zavala
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Paper Abstract

In this work, we show a simple device that helps in the use of the sub-aperture stitching method for testing convex surfaces with large diameter and a small f/#. This device was designed at INAOE’s Optical work shop to solve the problem that exists when a Newton Interferometer and the sub-aperture stitching method are used. It is well known that if the f/# of a surface is small, the slopes over the surface increases rapidly and this is critical for points far from the vertex. Therefore, if we use a reference master in the Newton interferometer to test a convex surface with a large diameter and an area far from the vertex, the master tends to slide causing scratches over the surface under test. To solve this problem, a device for mounting the surface under test with two freedom degrees, a rotating axis and a lever to tilt the surface, was designed. As result, the optical axis of the master can be placed in vertical position avoiding undesired movements of the master and making the sub-aperture stitching easier. We describe the proposed design and the results obtained with this device.

Paper Details

Date Published: 11 October 2015
PDF: 10 pages
Proc. SPIE 9633, Optifab 2015, 96331P (11 October 2015); doi: 10.1117/12.2195947
Show Author Affiliations
D. Aguirre-Aguirre, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
Univ. Nacional Autónoma de México (Mexico)
R. Izazaga-Pérez, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
B. Villalobos-Mendoza, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
E. Carrasco-Licea, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
F. S. Granados-Agustin, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
M. E. Percino-Zacarías, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
M. F. Salazar-Morales, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
E. Cruz-Zavala, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)


Published in SPIE Proceedings Vol. 9633:
Optifab 2015
Julie L. Bentley; Sebastian Stoebenau, Editor(s)

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