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Proceedings Paper

Combination of temporal phase unwrapping and long-wave infrared digital holographic interferometry for metrology of mosaic detector under space simulated conditions
Author(s): Jean-François Vandenrijt; Cédric Thizy; Florent Beaumont; José Garcia; Laurent Martin; Christophe Fabron; Eric Prieto; Thierry Maciaszek; Marc P. Georges
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Paper Abstract

We present digital holographic interferometry (DHI) in the long-wave infrared for monitoring the deformation under cryogenic conditions of a segmented focal plane array to be used in a space mission. The long wavelength was chosen for its ability to allow measurement of displacements 20 times larger than DHI in the visible and which were foreseen with the test object under such temperature changes. The specimen consists of 4x4 mosaic of detectors assembled on a frame. It was required to assess the global deformation of the ensemble, the deformation of each detector, and piston movements of each of them with respect to their neighbors. For that reason we incorporated the temporal phase unwrapping by capturing a sufficiently high number of holograms between which the phase does not suffer strong variations. At last since the specimen exhibit specular reflectivity at that wavelength, it is illuminated through a reflective diffuser.

Paper Details

Date Published: 24 August 2015
PDF: 7 pages
Proc. SPIE 9660, SPECKLE 2015: VI International Conference on Speckle Metrology, 96600J (24 August 2015); doi: 10.1117/12.2195896
Show Author Affiliations
Jean-François Vandenrijt, Univ. de Liège (Belgium)
Cédric Thizy, Univ. de Liège (Belgium)
Florent Beaumont, Lab. d'Astrophysique de Marseille (France)
José Garcia, Lab. d'Astrophysique de Marseille (France)
Laurent Martin, Lab. d'Astrophysique de Marseille (France)
Christophe Fabron, Lab. d'Astrophysique de Marseille (France)
Eric Prieto, Lab. d'Astrophysique de Marseille (France)
Thierry Maciaszek, Lab. d'Astrophysique de Marseille (France)
Marc P. Georges, Univ. de Liège (Belgium)

Published in SPIE Proceedings Vol. 9660:
SPECKLE 2015: VI International Conference on Speckle Metrology
Fernando Mendoza Santoyo; Eugenio R. Mendez, Editor(s)

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