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Proceedings Paper

Thickness and air gap measurement of assembled IR objectives
Author(s): B. Lueerss; P. Langehanenberg
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Paper Abstract

A growing number of applications like surveillance, thermography, or automotive demand for infrared imaging systems. Their imaging performance is significantly influenced by the alignment of the individual lenses. Besides the lateral orientation of lenses, the air spacing between the lenses is a crucial parameter. Because of restricted mechanical accessibility within an assembled objective, a non-contact technique is required for the testing of these parameters. So far, commercial measurement systems were not available for testing of IR objectives since most materials used for infrared imaging are non-transparent at wavelengths below 2 μm. We herewith present a time-domain low coherent interferometer capable of measuring any kind of infrared material (e.g., Ge, Si, etc.) as well as VIS materials. The set-up is based on a Michelson interferometer in which the light from a broadband superluminescent diode is split into a reference arm with a variable optical delay and a measurement arm where the sample is placed. On a detector, the reflected signals from both arms are superimposed and recorded as a function of the variable optical path. Whenever the group delay difference is zero, a coherence peak occurs and the relative distances of the lens surfaces are derived from the optical delay. In order to penetrate IR materials, the instrument operates at 2.2 μm. Together with an LWIR autocollimator, this technique allows for the determination of centering errors, lens thicknesses and air spacings of assembled IR objective lenses with a micron accuracy. It is therefore a tool for precision manufacturing and quality control.

Paper Details

Date Published: 13 October 2015
PDF: 10 pages
Proc. SPIE 9648, Electro-Optical and Infrared Systems: Technology and Applications XII; and Quantum Information Science and Technology, 96480D (13 October 2015); doi: 10.1117/12.2195648
Show Author Affiliations
B. Lueerss, TRIOPTICS GmbH (Germany)
P. Langehanenberg, TRIOPTICS GmbH (Germany)

Published in SPIE Proceedings Vol. 9648:
Electro-Optical and Infrared Systems: Technology and Applications XII; and Quantum Information Science and Technology
David A. Huckridge; Mark T. Gruneisen; Miloslav Dusek; Reinhard Ebert; John G. Rarity, Editor(s)

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