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Proceedings Paper

Creation and validation of Spectralon PTFE BRDF targets and standards
Author(s): Christopher Durell; Dan Scharpf; Greg McKee; Michelle L'Heureux; Georgi Georgiev; Gael Obein; Catherine Cooksey
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Paper Abstract

Sintered PTFE is an extremely stable, near-perfect Lambertian reflecting diffuser and calibration standard material that has been used by national labs, space, aerospace and commercial sectors for over two decades. New uncertainty targets of 2% on-orbit absolute validation in the Earth Observing Systems community have challenged the industry to improve is characterization and knowledge of almost every aspect of radiometric performance (space and ground). Assuming “near perfect” reflectance for angular dependent measurements is no longer going to suffice for many program needs. The total hemispherical spectral reflectance provides a good mark of general performance; but, without the angular characterization of bidirectional reflectance distribution function (BRDF) measurements, critical data is missing from many applications and uncertainty budgets. Therefore, traceable BRDF measurement capability is needed to characterize sintered PTFE’s angular response and provide a full uncertainty profile to users. This paper presents preliminary comparison measurements of the BRDF of sintered PTFE from several laboratories to better quantify the BRDF of sintered PTFE, assess the BRDF measurement comparability between laboratories, and improve estimates of measurement uncertainties under laboratory conditions.

Paper Details

Date Published: 12 October 2015
PDF: 12 pages
Proc. SPIE 9639, Sensors, Systems, and Next-Generation Satellites XIX, 96391D (12 October 2015); doi: 10.1117/12.2195503
Show Author Affiliations
Christopher Durell, Labsphere, Inc. (United States)
Dan Scharpf, Labsphere, Inc. (United States)
Greg McKee, Labsphere, Inc. (United States)
Michelle L'Heureux, Labsphere, Inc. (United States)
Georgi Georgiev, NASA Goddard Space Flight Ctr. (United States)
Gael Obein, CNAM LNE (France)
Catherine Cooksey, National Institute of Standards and Technology (United States)

Published in SPIE Proceedings Vol. 9639:
Sensors, Systems, and Next-Generation Satellites XIX
Roland Meynart; Steven P. Neeck; Haruhisa Shimoda, Editor(s)

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