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Proceedings Paper

SIBI: A compact hyperspectral camera in the mid-infrared
Author(s): Armande Pola Fossi; Yann Ferrec; Roland Domel; Christophe Coudrain; Nicolas Guerineau; Nicolas Roux; Oscar D'Almeida; Marc Bousquet; Emmanuel Kling; Hervé Sauer
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Paper Abstract

Recent developments in unmanned aerial vehicles have increased the demand for more and more compact optical systems. In order to bring solutions to this demand, several infrared systems are being developed at ONERA such as spectrometers, imaging devices, multispectral and hyperspectral imaging systems. In the field of compact infrared hyperspectral imaging devices, ONERA and Sagem Défense et Sécurité have collaborated to develop a prototype called SIBI, which stands for "Spectro-Imageur Birefringent Infrarouge". It is a static Fourier transform imaging spectrometer which operates in the mid-wavelength infrared spectral range and uses a birefringent lateral shearing interferometer. Up to now, birefringent interferometers have not been often used for hyperspectral imaging in the mid-infrared because of the lack of crystal manufacturers, contrary to the visible spectral domain where the production of uniaxial crystals like calcite are mastered for various optical applications. In the following, we will present the design and the realization of SIBI as well as the first experimental results.

Paper Details

Date Published: 16 October 2015
PDF: 8 pages
Proc. SPIE 9649, Electro-Optical Remote Sensing, Photonic Technologies, and Applications IX, 96490U (16 October 2015); doi: 10.1117/12.2195241
Show Author Affiliations
Armande Pola Fossi, ONERA (France)
Yann Ferrec, ONERA (France)
Roland Domel, ONERA (France)
Christophe Coudrain, ONERA (France)
Nicolas Guerineau, ONERA (France)
Nicolas Roux, Sagem (France)
Oscar D'Almeida, Safran Tech (France)
Marc Bousquet, Sagem (France)
Emmanuel Kling, Sagem (France)
Hervé Sauer, Lab. Charles Fabry (France)


Published in SPIE Proceedings Vol. 9649:
Electro-Optical Remote Sensing, Photonic Technologies, and Applications IX
Gary Kamerman; Ove Steinvall; Keith L. Lewis; John D. Gonglewski, Editor(s)

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