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Proceedings Paper

Bragg grating fabrication on tapered fiber tips based on focused ion beam milling
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Paper Abstract

Focused ion beam milling is used on chemically etched tapered fiber tips to create fiber Bragg gratings. These fiber Bragg gratings are based on a modulation of silica and external medium. This leads to a wide and structured spectrum obtained due to imperfections and the inherent structure of the tip. The fiber Bragg gratings presented are very short and have a length of 27 μm and 43 μm and are milled on the tapered fiber tip. They are characterized in the high temperature range 350-850ºC and a sensitivity of 14.4 pm/K is determined.

Paper Details

Date Published: 28 September 2015
PDF: 4 pages
Proc. SPIE 9634, 24th International Conference on Optical Fibre Sensors, 96343I (28 September 2015); doi: 10.1117/12.2194978
Show Author Affiliations
Ricardo M. André, INESC TEC (Portugal)
Univ. de Porto (Portugal)
Leibniz Institute of Photonic Technology (Germany)
Martin Becker, Leibniz Institute of Photonic Technology (Germany)
Jan Dellith, Leibniz Institute of Photonic Technology (Germany)
Manfred Rothhardt, Leibniz Institute of Photonic Technology (Germany)
M. I. Zibaii, Shahid Beheshti Univ. (Iran, Islamic Republic of)
H. Latifi, Shahid Beheshi Univ. (Iran, Islamic Republic of)
Manuel B. Marques, INESC TEC (Portugal)
Univ. de Porto (Portugal)
Hartmut Bartelt, Leibniz Institute of Photonic Technology (Germany)
Orlando Frazão, INESC TEC (Portugal)
Univ. de Porto (Portugal)


Published in SPIE Proceedings Vol. 9634:
24th International Conference on Optical Fibre Sensors
Hypolito José Kalinowski; José Luís Fabris; Wojtek J. Bock, Editor(s)

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