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High-resolution Brillouin analysis of composite materials beamsFormat | Member Price | Non-Member Price |
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Paper Abstract
High-resolution Brillouin optical correlation domain analysis of fibers embedded within beams of composite materials is performed with 4 cm resolution and 0.5 MHz sensitivity. Two new contributions are presented. First, analysis was carried out continuously over 30 hours following the production of a beam, observing heating during exothermal curing and buildup of residual strains. Second, the bending stiffness and Young's modulus of the composite beam were extracted based on distributed strain measurements, taken during a static three-point bending experiment. The calculated parameters were used to forecast the beam deflections. The latter were favorably compared against external displacement measurements.
Paper Details
Date Published: 28 September 2015
PDF: 4 pages
Proc. SPIE 9634, 24th International Conference on Optical Fibre Sensors, 96346N (28 September 2015); doi: 10.1117/12.2194521
Published in SPIE Proceedings Vol. 9634:
24th International Conference on Optical Fibre Sensors
Hypolito José Kalinowski; José Luís Fabris; Wojtek J. Bock, Editor(s)
PDF: 4 pages
Proc. SPIE 9634, 24th International Conference on Optical Fibre Sensors, 96346N (28 September 2015); doi: 10.1117/12.2194521
Show Author Affiliations
Yosef London, Bar-Ilan Univ. (Israel)
Yair Antman, Bar-Ilan Univ. (Israel)
Maayan Silbiger, Xenom Ltd. (Israel)
Liel Efraim, Bar-Ilan Univ. (Israel)
Yair Antman, Bar-Ilan Univ. (Israel)
Maayan Silbiger, Xenom Ltd. (Israel)
Liel Efraim, Bar-Ilan Univ. (Israel)
Avihay Froochzad, Bar-Ilan Univ. (Israel)
Gadi Adler, Xenom Ltd. (Israel)
Eyal Levenberg, Technion-Israel Institute of Technology (Israel)
Avi Zadok, Bar-Ilan Univ. (Israel)
Gadi Adler, Xenom Ltd. (Israel)
Eyal Levenberg, Technion-Israel Institute of Technology (Israel)
Avi Zadok, Bar-Ilan Univ. (Israel)
Published in SPIE Proceedings Vol. 9634:
24th International Conference on Optical Fibre Sensors
Hypolito José Kalinowski; José Luís Fabris; Wojtek J. Bock, Editor(s)
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