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Proceedings Paper

Analysis of cumulative versus ISO-recommended calculation of damage probability using a database of real S-on-1 tests
Author(s): Alexandru Zorila; Aurel Stratan; Ioana Dumitrache; Laurentiu Rusen; George Nemes
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Paper Abstract

Data collected in real S-on-1 LIDT experiments performed with a nanosecond, 1064 nm automated station are used to calculate the damage probability with the ISO-recommended (conventional) method and the recently-suggested cumulative method. The damage probability points versus fluence for each type of calculation are fitted using both, linear and nonlinear curves. The resultant four data sets corresponding to each real experiment are used to compare important parameters as: statistical uncertainty of damage probability points, fitting errors, damage threshold fluences for actual number of pulses, and the extrapolated threshold fluences for very large number of pulses. We suggest and analyze also a limit case of the cumulative method, when the damage probability points are calculated for each interrogated site. Both, the recently-suggested cumulative method, and our limit case, look very promising.

Paper Details

Date Published: 23 November 2015
PDF: 9 pages
Proc. SPIE 9632, Laser-Induced Damage in Optical Materials: 2015, 96321H (23 November 2015); doi: 10.1117/12.2194303
Show Author Affiliations
Alexandru Zorila, National Institute for Laser, Plasma and Radiation Physics (Romania)
Aurel Stratan, National Institute for Laser, Plasma and Radiation Physics (Romania)
Ioana Dumitrache, National Institute for Laser, Plasma and Radiation Physics (Romania)
Laurentiu Rusen, National Institute for Laser, Plasma and Radiation Physics (Romania)
George Nemes, National Institute for Laser, Plasma and Radiation Physics (Romania)
ASTiGMAT (United States)


Published in SPIE Proceedings Vol. 9632:
Laser-Induced Damage in Optical Materials: 2015
Gregory J. Exarhos; Vitaly E. Gruzdev; Joseph A. Menapace; Detlev Ristau; MJ Soileau, Editor(s)

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