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Proceedings Paper

Laser damage resistance of optical components in sub-picosecond regime in the infrared
Author(s): Martin Sozet; Jérôme Néauport; Eric Lavastre; Nadja Roquin; Laurent Gallais; Laurent Lamaignère
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Paper Abstract

A rasterscan procedure is set to determine laser-induced damage densities in sub-picosecond regime at 1053nm on high-reflective coatings. Whereas laser-induced damage is usually considered deterministic in this regime, damage events occur on these structures for fluences lower than their intrinsic Laser-Induced Damage Threshold (LIDT). Damage densities are found to be high even for fluences as low as 20% of the LIDT. Scanning Electron Microscope observations of these “under threshold” damage sites evidence ejections of defects, embedded in the dielectric stack. It brings a new viewpoint for the qualification of optical components and for the optimization of manufacturing processes of coatings.

Paper Details

Date Published: 23 November 2015
PDF: 9 pages
Proc. SPIE 9632, Laser-Induced Damage in Optical Materials: 2015, 96320N (23 November 2015); doi: 10.1117/12.2194286
Show Author Affiliations
Martin Sozet, CEA CESTA (France)
Aix Marseille Univ., Institut Fresnel, CNRS (France)
Jérôme Néauport, CEA CESTA (France)
Eric Lavastre, CEA CESTA (France)
Nadja Roquin, CEA CESTA (France)
Laurent Gallais, Aix Marseille Univ., Institut Fresnel, CNRS (France)
Laurent Lamaignère, CEA CESTA (France)


Published in SPIE Proceedings Vol. 9632:
Laser-Induced Damage in Optical Materials: 2015
Gregory J. Exarhos; Vitaly E. Gruzdev; Joseph A. Menapace; Detlev Ristau; MJ Soileau, Editor(s)

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