Share Email Print
cover

Proceedings Paper

Measurement of PSF for the extended depth of field of microscope based on liquid lens
Author(s): Yujia Xue; Yufu Qu; Shenyu Zhu
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

To obtain the accurate integral PSF of an extended depth of field (EDOF) microscope based on liquid tunable lens and volumetric sampling (VS) method, a method based on statistic and inverse filtering using quantum dot fluorescence nanosphere as a point source is proposed in this paper. First, a number of raw quantum dot images were captured separately when the focus length of the liquid lens was fixed and changed over the exposure time. Second, the raw images were separately added and averaged to obtain two noise-free mean images. Third, the integral PSF was achieved by computing the inverse Fourier transform of the mean image's Fourier transform caught when the focus lens is fixed divided by that when the focus length is changed. Finally, experimental results show that restored image using the measured accumulated PSF has good image quality and no artifacts.

Paper Details

Date Published: 5 August 2015
PDF: 10 pages
Proc. SPIE 9622, 2015 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 96221D (5 August 2015); doi: 10.1117/12.2193528
Show Author Affiliations
Yujia Xue, Beihang Univ. (China)
Yufu Qu, Beihang Univ. (China)
Shenyu Zhu, Beihang Univ. (China)


Published in SPIE Proceedings Vol. 9622:
2015 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology
Guangming Shi; Xuelong Li; Bormin Huang, Editor(s)

© SPIE. Terms of Use
Back to Top