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Proceedings Paper

A nondestructive characterization system of periodically poled crystals
Author(s): Huaixi Chen; Huang Zhou; Liyuan Chen; Xiaolin Zou; Long Miao; Xinkai Feng; Guangwei Li; Wanguo Liang
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Paper Abstract

Periodically poled crystals are widely used as SHG, DFG, SFG, OPO and THz generation, and there is a broad application prospect in some areas such as the laser display, optical fiber communication, atmospheric exploration and military confrontation. At present, to get the parameters of periodically poled crystals, like duty ratio, the main method is chemical etching of the samples. In this paper, we present a nondestructive characterization system of periodically poled crystals. When we apply a proper high voltage on both sides of the periodically poled crystal, the refractive index difference of positive and negative domain will be increased and we can observe a clear domain pattern by the a microscope so as to obtain general information. Then a single frequency laser is prepared to radiate on +z surface of the periodically poled crystal, we can get some orders of diffraction according to diffraction optics principle. Finally, we can measure the parameters such as period, duty ratio by use of numerical analysis. The testing sample size of this system can be up to 60mm, The accuracy of the testing period can be 0.1μm, and the measurement range of duty ratio is 20%-50%.

Paper Details

Date Published: 5 August 2015
PDF: 7 pages
Proc. SPIE 9618, 2015 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 96180Z (5 August 2015); doi: 10.1117/12.2193324
Show Author Affiliations
Huaixi Chen, Fujian Institute of Research on the Structure of Matter (China)
Huang Zhou, Fujian Institute of Research on the Structure of Matter (China)
Liyuan Chen, Fujian Institute of Research on the Structure of Matter (China)
Xiaolin Zou, Fujian Institute of Research on the Structure of Matter (China)
Long Miao, Fujian Institute of Research on the Structure of Matter (China)
Xinkai Feng, Fujian Institute of Research on the Structure of Matter (China)
Guangwei Li, Fujian Institute of Research on the Structure of Matter (China)
Wanguo Liang, Fujian Institute of Research on the Structure of Matter (China)


Published in SPIE Proceedings Vol. 9618:
2015 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
Yongtian Wang; Xiaodi Tan; Kimio Tatsuno, Editor(s)

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