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Proceedings Paper

Optimization of curved drift tubes for ultraviolet-ion mobility spectrometry
Author(s): Kai Ni; Guangli Ou; Xiaoguo Zhang; Zhou Yu; Quan Yu; Xiang Qian; Xiaohao Wang
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Paper Abstract

Ion mobility spectrometry (IMS) is a key trace detection technique for toxic pollutants and explosives in the atmosphere. Ultraviolet radiation photoionization source is widely used as an ionization source for IMS due to its advantages of high selectivity and non-radioactivity. However, UV-IMS bring problems that UV rays will be launched into the drift tube which will cause secondary ionization and lead to the photoelectric effect of the Faraday disk. So air is often used as working gas to reduce the effective distance of UV rays, but it will limit the application areas of UV-IMS. In this paper, we propose a new structure of curved drift tube, which can avoid abnormally incident UV rays. Furthermore, using curved drift tube may increase the length of drift tube and then improve the resolution of UV-IMS according to previous research. We studied the homogeneity of electric field in the curved drift tube, which determined the performance of UV-IMS. Numerical simulation of electric field in curved drift tube was conducted by SIMION in our study. In addition, modeling method and homogeneity standard for electric field were also presented. The influences of key parameters include radius of gyration, gap between electrode as well as inner diameter of curved drift tube, on the homogeneity of electric field were researched and some useful laws were summarized. Finally, an optimized curved drift tube is designed to achieve homogenous drift electric field. There is more than 98.75% of the region inside the curved drift tube where the fluctuation of the electric field strength along the radial direction is less than 0.2% of that along the axial direction.

Paper Details

Date Published: 7 August 2015
PDF: 9 pages
Proc. SPIE 9623, 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 962317 (7 August 2015); doi: 10.1117/12.2193266
Show Author Affiliations
Kai Ni, Graduate School at Shenzhen, Tsinghua Univ. (China)
Guangli Ou, Graduate School at Shenzhen, Tsinghua Univ. (China)
Xiaoguo Zhang, Graduate School at Shenzhen, Tsinghua Univ. (China)
Zhou Yu, Graduate School at Shenzhen, Tsinghua Univ. (China)
Quan Yu, Graduate School at Shenzhen Tsinghua Univ (China)
Xiang Qian, Graduate School at Shenzhen, Tsinghua Univ. (China)
Xiaohao Wang, Graduate School at Shenzhen, Tsinghua Univ. (China)


Published in SPIE Proceedings Vol. 9623:
2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Sen Han, Editor(s)

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