Share Email Print

Proceedings Paper

The L_infinity constrained global optimal histogram equalization technique for real time imaging
Author(s): Qiongwei Ren; Yi Niu; Lin Liu; Yang Jiao; Guangming Shi
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Although the current imaging sensors can achieve 12 or higher precision, the current display devices and the commonly used digital image formats are still only 8 bits. This mismatch causes significant waste of the sensor precision and loss of information when storing and displaying the images. For better usage of the precision-budget, tone mapping operators have to be used to map the high-precision data into low-precision digital images adaptively. In this paper, the classic histogram equalization tone mapping operator is reexamined in the sense of optimization. We point out that the traditional histogram equalization technique and its variants are fundamentally improper by suffering from local optimum problems. To overcome this drawback, we remodel the histogram equalization tone mapping task based on graphic theory which achieves the global optimal solutions. Another advantage of the graphic-based modeling is that the tone-continuity is also modeled as a vital constraint in our approach which suppress the annoying boundary artifacts of the traditional approaches. In addition, we propose a novel dynamic programming technique to solve the histogram equalization problem in real time. Experimental results shows that the proposed tone-preserved global optimal histogram equalization technique outperforms the traditional approaches by exhibiting more subtle details in the foreground while preserving the smoothness of the background.

Paper Details

Date Published: 5 August 2015
PDF: 4 pages
Proc. SPIE 9622, 2015 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 962206 (5 August 2015); doi: 10.1117/12.2193251
Show Author Affiliations
Qiongwei Ren, Xidian Univ. (China)
Yi Niu, Xidian Univ. (China)
Lin Liu, Xidian Univ. (China)
Yang Jiao, Xidian Univ. (China)
Guangming Shi, Xidian Univ. (China)

Published in SPIE Proceedings Vol. 9622:
2015 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology
Guangming Shi; Xuelong Li; Bormin Huang, Editor(s)

© SPIE. Terms of Use
Back to Top