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Proceedings Paper

Intraocular lens power estimation by accurate ray tracing for eyes underwent previous refractive surgeries
Author(s): Que Yang; Shanshan Wang; Kai Wang; Chunyu Zhang; Lu Zhang; Qingyu Meng; Qiudong Zhu
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Paper Abstract

For normal eyes without history of any ocular surgery, traditional equations for calculating intraocular lens (IOL) power, such as SRK-T, Holladay, Higis, SRK-II, et al., all were relativley accurate. However, for eyes underwent refractive surgeries, such as LASIK, or eyes diagnosed as keratoconus, these equations may cause significant postoperative refractive error, which may cause poor satisfaction after cataract surgery. Although some methods have been carried out to solve this problem, such as Hagis-L equation[1], or using preoperative data (data before LASIK) to estimate K value[2], no precise equations were available for these eyes. Here, we introduced a novel intraocular lens power estimation method by accurate ray tracing with optical design software ZEMAX. Instead of using traditional regression formula, we adopted the exact measured corneal elevation distribution, central corneal thickness, anterior chamber depth, axial length, and estimated effective lens plane as the input parameters. The calculation of intraocular lens power for a patient with keratoconus and another LASIK postoperative patient met very well with their visual capacity after cataract surgery.

Paper Details

Date Published: 7 August 2015
PDF: 8 pages
Proc. SPIE 9623, 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 962311 (7 August 2015); doi: 10.1117/12.2193057
Show Author Affiliations
Que Yang, Beijing Institute of Technology (China)
Shanshan Wang, Beijing Institute of Technology (China)
Kai Wang, Peking Univ. People's Hospital (China)
Lab. of Vision Loss and Restoration (China)
Chunyu Zhang, Beijing Institute of Technology (China)
Lu Zhang, Peking Univ. People's Hospital (China)
Qingyu Meng, Peking Univ. People's Hospital (China)
Qiudong Zhu, Beijing Institute of Technology (China)

Published in SPIE Proceedings Vol. 9623:
2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Sen Han, Editor(s)

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