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Proceedings Paper

Application research on microchannel plate in new fields
Author(s): Yanhong Li; Xiaomei Chen; Guoqiang Ni
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Paper Abstract

Microchannel plate (MCP) is a photoelectron multiplier as the core component of low-level light (LLL) image intensifier. MCP has two-dimensional space, time, and energy resolution, fast response time, low background noise, wide dynamic range and high gain characteristics, as well as electrons, ions, UV and soft X-ray photon detection capability directly. In recent years, with the publication of foreign advanced technology and Chinese research staff in-depth understanding of MCP’s unique characteristics, the applications of MCP have extended into many new fields accordingly in China. In addition to the image intensifier, the MCP can be used in deep space exploration and scientific experiments, detecting kinds of trace rays and particles, such as pulsars navigation, nuclear simulation diagnostics, UV, EUV, neutron, neutrino detection and imaging. North Night Vision Technology Co. Ltd (NVT) as the only unit possessing MCP production capacity in China is constantly working on improving, innovation and application research on MCP technology. In this paper, based on the researches on MCP in some new fields the NVT Company has undertaken and ongoing, the technological breakthroughs and application research progresses achieved are described.

Paper Details

Date Published: 10 August 2015
PDF: 5 pages
Proc. SPIE 9620, 2015 International Conference on Optical Instruments and Technology: Optical Sensors and Applications, 96200W (10 August 2015); doi: 10.1117/12.2193055
Show Author Affiliations
Yanhong Li, Beijing Institute of Technology (China)
North Night Vision Technology Co., Ltd (China)
Xiaomei Chen, Beijing Institute of Technology (China)
Guoqiang Ni, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 9620:
2015 International Conference on Optical Instruments and Technology: Optical Sensors and Applications
Xuping Zhang; David Erickson; Xudong Fan; Zhongping Chen, Editor(s)

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