Share Email Print

Proceedings Paper

Two-dimensional thickness measurement using acousto-optically tuned external cavity laser diode
Author(s): Takamasa Suzuki; Shingo Abe; Samuel Choi
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

We propose a swept source optical coherence tomography that uses an original external-cavity laser diode and demonstrate measurements of thickness distribution in two dimensions using this equipment. We first conducted high-speed, wide-range wavelength scanning with an external-cavity laser diode that was equipped with a special antireflection-coated laser diode working at 770 nm. Using an acousto-optic deflector enabled a tuning range and rate of 22 nm and 20 kHz, respectively, with no mechanical elements. Next, we applied this source to an optical coherence tomography and measured the two-dimensional distribution of thickness of a thin glass plate.

Paper Details

Date Published: 24 September 2015
PDF: 8 pages
Proc. SPIE 9628, Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V, 96281K (24 September 2015); doi: 10.1117/12.2193027
Show Author Affiliations
Takamasa Suzuki, Niigata Univ. (Japan)
Shingo Abe, Niigata Univ (Japan)
Samuel Choi, Niigata Univ. (Japan)

Published in SPIE Proceedings Vol. 9628:
Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V
Angela Duparré; Roland Geyl, Editor(s)

© SPIE. Terms of Use
Back to Top