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Proceedings Paper

Single emitter localization analysis in the presence of background
Author(s): S. Stallinga
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Paper Abstract

Localization microscopy for imaging at the nano-scale relies on the quality of fitting the emitter positions from the measured light spots. The type and magnitude of the noise in the detection process, the background light level and the Point Spread Function model that is used in the fit are of paramount importance for the precision and accuracy of the fit. We present several developments on the computational methods and performance limits of single emitter localization, targeting specifically these three aspects.

Paper Details

Date Published: 23 September 2015
PDF: 7 pages
Proc. SPIE 9630, Optical Systems Design 2015: Computational Optics, 96300V (23 September 2015); doi: 10.1117/12.2192043
Show Author Affiliations
S. Stallinga, Technische Univ. Delft (Netherlands)


Published in SPIE Proceedings Vol. 9630:
Optical Systems Design 2015: Computational Optics
Daniel G. Smith; Frank Wyrowski; Andreas Erdmann, Editor(s)

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