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Proceedings Paper

A high spatial resolution infrared scene projector
Author(s): Yang Yang; Shi Nuo; Lang Zhou; Chang Xu; Li Zhang; Yanghong Li; Xin Wang; Zhuo Li
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Paper Abstract

An infrared scene projector with high spatial resolution using the visible to infrared transducer is described in this paper. The film transducer is fabricated by MEMS technology. The single pixel with 25×25μm in sizes and 35um at intervals in a transducer which is 76.2mm (3 inch) diameter is realized. So, the array size of the film transducer is more than 1024×1024. Illuminated by a visible light projector with different intensities, the equivalent black body temperature of the transducer could be varied in the range of 293K to 573K. The emission spectrum is similar with the blackbody and the gray scale is more than 200.

Paper Details

Date Published: 5 August 2015
PDF: 6 pages
Proc. SPIE 9618, 2015 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 96180C (5 August 2015); doi: 10.1117/12.2191984
Show Author Affiliations
Yang Yang, Beijing Institute of Technology (China)
Beijing Key Lab. for Precision Optoelectronic Measurement and Technology (China)
Shanghai Institute of Electro-mechanical Engineering (China)
Shi Nuo, Beijing Institute of Technology (China)
Beijing Key Lab. for Precision Optoelectronic Measurement and Technology (China)
Lang Zhou, Beijing Institute of Technology (China)
Beijing Key Lab. for Precision Optoelectronic Measurement and Technology (China)
Chang Xu, Beijing Institute of Technology (China)
Beijing Key Lab. for Precision Optoelectronic Measurement and Technology (China)
Li Zhang, Shanghai Institute of Electro-mechanical Engineering (China)
Yanghong Li, Shanghai Institute of Electro-mechanical Engineering (China)
Xin Wang, Beijing Institute of Technology (China)
Beijing Key Lab. for Precision Optoelectronic Measurement and Technology (China)
Zhuo Li, Beijing Institute of Technology (China)
Beijing Key Lab. for Precision Optoelectronic Measurement and Technology (China)


Published in SPIE Proceedings Vol. 9618:
2015 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
Yongtian Wang; Xiaodi Tan; Kimio Tatsuno, Editor(s)

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