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Proceedings Paper

Primary calibration of solar cells based on DSR method at the National Institute of Metrology of China
Author(s): Yingwei He; Limin Xiong; Junchao Zhang; Haifeng Meng; Chuan Cai; Bifeng Zhang; Linlin Xie; Dingpu Liu
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Paper Abstract

A primary standard measurement facility based on differential spectral responsivity (DSR) method for calibration of reference solar cells was realized at National Institute of Metrology (NIM), China. The primary calibration of the critical spectral parameters and short-circuit current of reference cells, not only with WPVS (World photovoltaic Scale) design but with non-regularly shaped, can be performed by this standard facility. The linearity measurement can be carried out by measuring DSR of the solar cells at different bias levels in the spectral range from 300nm to 1200nm. The characterization and performance of the facility were reported. An uncertainty of 0.9% (k=2) for short-circuit current of WPVS reference solar cells was able to be obtained. A more accurate and better calibration service for solar photovoltaic (PV) cells could be provided to local or international solar cell research community, testing labs and industry users and manufacturers.

Paper Details

Date Published: 7 August 2015
PDF: 5 pages
Proc. SPIE 9623, 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 96230S (7 August 2015); doi: 10.1117/12.2191490
Show Author Affiliations
Yingwei He, National Institute of Metrology (China)
Limin Xiong, National Institute of Metrology (China)
Junchao Zhang, National Institute of Metrology (China)
Haifeng Meng, National Institute of Metrology (China)
Chuan Cai, Beijing Institute of Technology (China)
Bifeng Zhang, National Institute of Metrology (China)
Linlin Xie, National Institute of Metrology (China)
Dingpu Liu, China Academy of Telecommunication Research (China)


Published in SPIE Proceedings Vol. 9623:
2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Sen Han, Editor(s)

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