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Proceedings Paper

Conversion of radius of curvature to power (and vice versa)
Author(s): Sven Wickenhagen; Kazumasa Endo; Ulrike Fuchs; Richard N. Youngworth; Sven R. Kiontke
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Paper Abstract

Manufacturing optical components relies on good measurements and specifications. One of the most precise measurements routinely required is the form accuracy. In practice, form deviation from the ideal surface is effectively low frequency errors, where the form error most often accounts for no more than a few undulations across a surface. These types of errors are measured in a variety of ways including interferometry and tactile methods like profilometry, with the latter often being employed for aspheres and general surface shapes such as freeforms. This paper provides a basis for a correct description of power and radius of curvature tolerances, including best practices and calculating the power value with respect to the radius deviation (and vice versa) of the surface form. A consistent definition of the sagitta is presented, along with different cases in manufacturing that are of interest to fabricators and designers. The results make clear how the definitions and results should be documented, for all measurement setups. Relationships between power and radius of curvature are shown that allow specifying the preferred metric based on final accuracy and measurement method. Results shown include all necessary equations for conversion to give optical designers and manufacturers a consistent and robust basis for decision-making. The paper also gives guidance on preferred methods for different scenarios for surface types, accuracy required, and metrology methods employed.

Paper Details

Date Published: 5 October 2015
PDF: 10 pages
Proc. SPIE 9628, Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V, 962813 (5 October 2015); doi: 10.1117/12.2191400
Show Author Affiliations
Sven Wickenhagen, asphericon GmbH (Germany)
Kazumasa Endo, Nikon Core Technology Div. (Japan)
Ulrike Fuchs, asphericon GmbH (Germany)
Richard N. Youngworth, Riyo LLC (United States)
Sven R. Kiontke, asphericon GmbH (Germany)


Published in SPIE Proceedings Vol. 9628:
Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V
Angela Duparré; Roland Geyl, Editor(s)

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