Share Email Print

Proceedings Paper

The normal-incidence multilayered diffraction grating for the high resolution astrophysical extreme ultraviolet spectroscopy
Author(s): Xiaowei Yang; Igor V. Kozhevnikov; Qiushi Huang; Dechao Xu; Jiang Li; Zhong Zhang; Zhanshan Wang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The high resolution extreme ultraviolet spectroscopy mission based on the normal-incidence multilayered diffraction grating technology, which provides high effective area and spectral resolution, can carry out a survey of local Galactic stellar and white dwarf targets. Compared to grazing-incidence systems, this approach allows previous observatory-class science to be delivered in a low-cost package. The instrument has already been proven in two sub-orbital space flights. However, the multilayer used before is periodic one and the working band-pass is limited. In this paper, the spectroscopic properties of a normal-incidence multilayered diffraction grating were simulated with three kinds multilayers for the wavelength range between 17.5nm and 25.0nm, which includes lines of Fe VIII to XIII that will be strongest in the cooler (solar like) coronae, plus some weaker lines of O, Si, S and Ar. The highest efficiency at central wavelength of band-pass can be obtained if the periodic multilayer is adopted. The most flat response efficiency can be achieved if we utilized a non-periodic multilayer. The simulation results demonstrated that the choice of the multilayer is dependent on the requirement to the spectroscopy mission and should be considered carefully.

Paper Details

Date Published: 23 September 2015
PDF: 9 pages
Proc. SPIE 9627, Optical Systems Design 2015: Advances in Optical Thin Films V, 96271L (23 September 2015); doi: 10.1117/12.2191307
Show Author Affiliations
Xiaowei Yang, Tongji Univ. (China)
Igor V. Kozhevnikov, A.V. Shubnikov Institute of Crystallography (Russian Federation)
Qiushi Huang, Tongji Univ. (China)
Dechao Xu, Tongji Univ. (China)
Jiang Li, Tongji Univ. (China)
Zhong Zhang, Tongji Univ. (China)
Zhanshan Wang, Tongji Univ. (China)

Published in SPIE Proceedings Vol. 9627:
Optical Systems Design 2015: Advances in Optical Thin Films V
Michel Lequime; H. Angus Macleod; Detlev Ristau, Editor(s)

© SPIE. Terms of Use
Back to Top