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Proceedings Paper

Recent developments of interferometric wavefront sensing
Author(s): Dong Liu; Yongying Yang; Xiaoyu Chen; Tong Ling; Lei Zhang; Jian Bai; Yibing Shen
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Paper Abstract

Recent trends of interferometric wavefront sensing tend to focus on high precision, anti-vibration, compact, along with much more involved of electric and computer technology. And the optical principles employed not only limit to interference but also include diffraction, scattering, polarization, etc. In this paper, some selected examples basing on the research works in our group will be given to illustrate the trends mentioned above. To achieve extra high accuracy, phase-shifting point diffraction interferometry (PS-PDI) is believed to be a good candidate as it employs a nearly perfect point diffraction spherical wavefront as the reference and also takes advantage of the high precision of phase-shifting algorithms. Cyclic radial shearing interferometry (C-RSI) successively demonstrate the anti-vibration characteristic and can diagnose transient wavefront with only one single shot by employing a three-mirror common-path configuration and a synchronizing system. In contrast sharply with those early interferometers, interferometers with very compact configuration are more suitable to develop portable wavefront sensing instruments. Cross-grating lateral shearing interferometer (CG-LSI) is a very compact interferometer that adopts a cross-grating of millimeters to produce lateral shearing of the diffraction wave of the test wavefront. Be aware that, computer technique has been used a lot in all of the above interferometers but the non-null annual sub-aperture stitching interferometer (NASSI) for general aspheric surface testing mostly relies on the computer model of the physical interferometer setup and iterative ray-tracing optimization. The principles of the above mentioned interferometric wavefront sensing methods would be given in detail.

Paper Details

Date Published: 7 August 2015
PDF: 10 pages
Proc. SPIE 9623, 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 962303 (7 August 2015); doi: 10.1117/12.2191222
Show Author Affiliations
Dong Liu, Zhejiang Univ. (China)
Yongying Yang, Zhejiang Univ. (China)
Xiaoyu Chen, Zhejiang Univ. (China)
Tong Ling, Zhejiang Univ. (China)
Lei Zhang, Zhejiang Univ. (China)
Jian Bai, Zhejiang Univ. (China)
Yibing Shen, Zhejiang Univ. (China)


Published in SPIE Proceedings Vol. 9623:
2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Sen Han, Editor(s)

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