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Proceedings Paper

A Bohmian analysis of Afshar's experiment
Author(s): Juan David Navia; John H. Reina; Detlef Dürr
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Proc. SPIE 9526, Modeling Aspects in Optical Metrology V, 95261P; doi: 10.1117/12.2190730
Show Author Affiliations
Juan David Navia, Univ. del Valle (Colombia)
John H. Reina, Univ. del Valle (Colombia)
Detlef Dürr, Ludwig-Maximilians-Univ. München (Germany)


Published in SPIE Proceedings Vol. 9526:
Modeling Aspects in Optical Metrology V
Bernd Bodermann; Karsten Frenner; Richard M. Silver, Editor(s)

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