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Proceedings Paper

Resolution enhancement in a double-helix phase engineered scanning microscope (RESCH microscope) (Presentation Recording)
Author(s): Alexander Jesacher; Monika Ritsch-Marte; Rafael Piestun

Paper Abstract

Recently we introduced RESCH microscopy [1] - a scanning microscope that allows slightly refocusing the sample after the acquisition has been performed, solely by performing appropriate data post-processing. The microscope features a double-helix phase-engineered emission point spread function in combination with camera-based detection. Based on the principle of transverse resolution enhancement in Image Scanning Microscopy [2,3], we demonstrate similar resolution improvement in RESCH. Furthermore, we outline a pathway for how the collected 3D sample information can be used to construct sharper optical sections. [1] A. Jesacher, M. Ritsch-Marte and R. Piestun, accepted for Optica. [2] C.J.R. Sheppard, “Super-resolution in Confocal imaging,” Optik, 80, 53-54 (1988). [3] C.B. Müller and J. Enderlein "Image Scanning Microscopy," Phys. Rev. Lett. 104, 198101 (2010).

Paper Details

Date Published: 5 October 2015
PDF: 1 pages
Proc. SPIE 9554, Nanoimaging and Nanospectroscopy III, 95540S (5 October 2015); doi: 10.1117/12.2190639
Show Author Affiliations
Alexander Jesacher, Medizinische Univ. Innsbruck (Austria)
Monika Ritsch-Marte, Medizinische Univ. Innsbruck (Austria)
Rafael Piestun, Univ. of Colorado at Boulder (United States)


Published in SPIE Proceedings Vol. 9554:
Nanoimaging and Nanospectroscopy III
Prabhat Verma; Alexander Egner, Editor(s)

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