Share Email Print

Proceedings Paper

Speckle referencing: digital speckle pattern interferometry (SR- DSPI) for imaging of non-diffusive surfaces
Author(s): Chaolong Song; Murukeshan V. Matham; Kelvin H. K. Chan
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Optical metrology has been widely employed as a key technique for modern industrial production, owing to its fast, precise and non-invasive measurement. Digital speckle pattern interferometry (DSPI) is one of these non-destructive testing methods that possess the abilities to measure surface deformation, vibration and profile. However, one of the challenges with DSPI is the incapability to address the imaging of non-diffusive surface, owing to the failure to form speckle pattern. In this paper, we demonstrate a modified DSPI system used for non-diffusive surface measurement. Experiment has been carried out to validate this modified DSPI by using metal-alloy surface as testing sample. The speckle fringe pattern generated by applying an external load was analyzed to obtain the 3-D surface deformation parameters.

Paper Details

Date Published: 17 July 2015
PDF: 6 pages
Proc. SPIE 9524, International Conference on Optical and Photonic Engineering (icOPEN 2015), 95242P (17 July 2015); doi: 10.1117/12.2190504
Show Author Affiliations
Chaolong Song, Nanyang Technological Univ. (Singapore)
Murukeshan V. Matham, Nanyang Technological Univ. (Singapore)
Kelvin H. K. Chan, Nanyang Technological Univ. (Singapore)
Rolls-Royce Singapore Pte Ltd. (Singapore)

Published in SPIE Proceedings Vol. 9524:
International Conference on Optical and Photonic Engineering (icOPEN 2015)
Anand K. Asundi; Yu Fu, Editor(s)

© SPIE. Terms of Use
Back to Top