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Proceedings Paper

Nanoscale characterization and modeling of the variability in metal oxide resistive switching memory
Author(s): Matthew J. Marinella; David R. Hughart; Patrick R. Mickel; Stephen W. Howell; Ed Bielejec; George Vizkelethy; Jose L. Pacheco; Rudeger H.T. Wilke; Sapan Agarwal; Conrad D. James
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Paper Details

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Proc. SPIE 9553, Low-Dimensional Materials and Devices, 95530U; doi: 10.1117/12.2190471
Show Author Affiliations
Matthew J. Marinella, Sandia National Labs. (United States)
David R. Hughart, Sandia National Labs. (United States)
Patrick R. Mickel, Sandia National Labs. (United States)
Stephen W. Howell, Sandia National Labs. (United States)
Ed Bielejec, Sandia National Labs. (United States)
George Vizkelethy, Sandia National Labs. (United States)
Jose L. Pacheco, Sandia National Labs. (United States)
Rudeger H.T. Wilke, Sandia National Labs. (United States)
Sapan Agarwal, Sandia National Labs. (United States)
Conrad D. James, Sandia National Labs. (United States)


Published in SPIE Proceedings Vol. 9553:
Low-Dimensional Materials and Devices
Nobuhiko P. Kobayashi; A. Alec Talin; M. Saif Islam; Albert V. Davydov, Editor(s)

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