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Proceedings Paper

Theoretical analysis of the strain mapping in a single core-shell nanowire by x-ray Bragg ptychography
Author(s): Dmitry Dzhigaev; Tomaš Stankevič; Ilya Besedin; Sergey Lazarev; Anatoly Shabalin; Mikhail N. Strikhanov; Robert Feidenhans'l; Ivan A. Vartanyants
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Paper Abstract

X-ray Bragg ptychography (XBP) is an experimental technique for high-resolution strain mapping in a single nano- and mesoscopic crystalline structures. In this work we discuss the conditions that allow direct interpretation of the ptychographic reconstructions in terms of the strain distribution obtained from the two dimensional (2D) XBP. Simulations of the 2D XBP experiments under realistic experimental conditions are performed with a model of InGaN/GaN core-shell nanowire with low (1%) and high (30%) Indium concentrations in the shell.

Paper Details

Date Published: 18 September 2015
PDF: 8 pages
Proc. SPIE 9592, X-Ray Nanoimaging: Instruments and Methods II, 95920S (18 September 2015); doi: 10.1117/12.2190416
Show Author Affiliations
Dmitry Dzhigaev, Deutsches Elektronen-Synchrotron (Germany)
National Research Nuclear Univ. MEPhI (Russian Federation)
Tomaš Stankevič, Univ. of Copenhagen (Denmark)
Ilya Besedin, Deutsches Elektronen-Synchrotron (Germany)
National Research Nuclear Univ. MEPhI (Russian Federation)
Sergey Lazarev, Deutsches Elektronen-Synchrotron (Germany)
National Research Tomsk Polytechnic Univ. (Russian Federation)
Anatoly Shabalin, Deutsches Elektronen-Synchrotron (Germany)
Mikhail N. Strikhanov, National Research Nuclear Univ. MEPhI (Russian Federation)
Robert Feidenhans'l, Univ. of Copenhagen (Denmark)
Ivan A. Vartanyants, Deutsches Elektronen-Synchrotron (Germany)
National Research Nuclear Univ. MEPhI (Russian Federation)


Published in SPIE Proceedings Vol. 9592:
X-Ray Nanoimaging: Instruments and Methods II
Barry Lai, Editor(s)

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