Share Email Print
cover

Proceedings Paper

Gated photocathode design for the P510 electron tube used in the National Ignition Facility (NIF) optical streak cameras
Author(s): P. Datte; G. James; P. Celliers; D. Kalantar; G. Vergel de Dios
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The optical streak cameras currently used at the National Ignition Facility (NIF) implement the P510 electron tube from Photonis1. The existing high voltage electronics provide DC bias voltages to the cathode, slot, and focusing electrodes. The sweep deflection plates are driven by a ramp voltage. This configuration has been very successful for the majority of measurements required at NIF. New experiments require that the photocathode be gated or blanked to reduce the effects of undesirable scattered light competing with low light level experimental data. The required ~2500V gate voltage is applied between the photocathode and the slot electrode in response to an external trigger to allow the electrons to flow. Otherwise the slot electrode is held approximately 100 Volts more negative than the potential of the photocathode, preventing electron flow. This article reviews the implementation and performance of the gating circuit that applies an electronic gate to the photocathode with a nominal 50ns rise and fall time, and a pulse width between 50ns and 2000ns.

Paper Details

Date Published: 31 August 2015
PDF: 13 pages
Proc. SPIE 9591, Target Diagnostics Physics and Engineering for Inertial Confinement Fusion IV, 95910D (31 August 2015); doi: 10.1117/12.2190224
Show Author Affiliations
P. Datte, Lawrence Livermore National Lab. (United States)
G. James, Lawrence Livermore National Lab. (United States)
P. Celliers, Lawrence Livermore National Lab. (United States)
D. Kalantar, Lawrence Livermore National Lab. (United States)
G. Vergel de Dios, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 9591:
Target Diagnostics Physics and Engineering for Inertial Confinement Fusion IV
Jeffrey A. Koch; Gary P. Grim, Editor(s)

© SPIE. Terms of Use
Back to Top