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Proceedings Paper

Comparative performance of large-format MWIR and LWIR systems in NV-IPM
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Paper Abstract

This report describes tasks comparing the simulated performance levels of infrared (IR) sensing systems in detecting, recognizing, and identifying (DRI) targets using the Night Vision Integrated Performance Model (NV-IPM) version 1.1. Both mid-wave infrared (MWIR) and long-wave infrared (LWIR) systems, chosen to represent the current state-of-the-art, were analyzed across various environmental conditions. These states included a range of both man-made and natural obscurants, selected to simulate atmospheric conditions commonly experienced throughout the world. This report investigates the validity of the NV-IPM, down-selects top-performing systems from an original set, and provides detailed performance analysis of these best-of-breed systems in various environmental scenarios. Six sensing systems, Indium-Antimonide (InSb) MWIR, Mercury-Cadmium-Telluride (MCT) MWIR, nBn InSb MWIR, Quantum Well Infrared Photodetector (QWIP) LWIR, uncooled LWIR, and dual-band MCT MWIR/LWIR system, were evaluated against a variety of environmental variations. Specifications for the IR systems were obtained from manufacturers or relevant published literature. Simulation results indicated the nBn InSb MWIR system as the strongest-performing system in many of the tests.

Paper Details

Date Published: 15 May 2015
PDF: 9 pages
Proc. SPIE 9452, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVI, 94520O (15 May 2015); doi: 10.1117/12.2190158
Show Author Affiliations
Edward M. Burdette, Georgia Tech Research Institute (United States)
James R. Teague, Georgia Tech Research Institute (United States)
Christopher L. Dobbins, Aviation and Missile Research Development and Engineering Ctr. (United States)
Samuel B. Wood, Aviation and Missile Research Development and Engineering Ctr. (United States)


Published in SPIE Proceedings Vol. 9452:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVI
Gerald C. Holst; Keith A. Krapels, Editor(s)

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