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Proceedings Paper

FXI: a full-field imaging beamline at NSLS-II
Author(s): Wah-Keat Lee; Ruben Reininger; William Loo; Richard Gambella; Steven O'Hara; Yong S. Chu; Zhong Zhong; Jun Wang
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Paper Abstract

The Full-field X-ray Imaging (FXI) beamline at the NSLS-II is designed for optimum performance of a transmission x-ray microscope (TXM). When complete, FXI will enable the TXM to obtain individual 2D projection images at 30 nm spatial resolution and up to 40 microns field of view (FOV) with exposure times of < 50 ms per image. A complete 3D nanotomography data set should take less than 1 minute. This will open opportunities for many real-time in-operando studies.

Paper Details

Date Published: 18 September 2015
PDF: 7 pages
Proc. SPIE 9592, X-Ray Nanoimaging: Instruments and Methods II, 959209 (18 September 2015); doi: 10.1117/12.2189914
Show Author Affiliations
Wah-Keat Lee, Brookhaven National Lab. (United States)
Ruben Reininger, Brookhaven National Lab. (United States)
William Loo, Brookhaven National Lab. (United States)
Richard Gambella, Brookhaven National Lab. (United States)
Steven O'Hara, Brookhaven National Lab. (United States)
Yong S. Chu, Brookhaven National Lab. (United States)
Zhong Zhong, Brookhaven National Lab. (United States)
Jun Wang, Brookhaven National Lab. (United States)


Published in SPIE Proceedings Vol. 9592:
X-Ray Nanoimaging: Instruments and Methods II
Barry Lai, Editor(s)

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