Share Email Print

Proceedings Paper

The effect of thermal annealing on additive migration to the organic/metal interface in OPVs
Author(s): J. Vinokur; I. Deckman; S. Obuchovsky; K. Weinfeld; G. L. Frey
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The power conversion efficiency of solar cells based on conjugated polymer:fullerene derivative donor:acceptor bulk heterojunctions is not yet sufficient for commercialization. The two most common techniques used to enhance cell performances are thermal treatments and utilization of interlayers. In this work we investigated the effect of the sequence of thermal annealing and the metal evaporation on interlayer formation induced by additives migration toward the metal/organic interface. For this purpose we chose to study P3HT:PCBM:PEG blends, on which we performed thermal annealing before or after the Al cathode deposition. We further characterized the device performances and determined, by XPS, the blend/Al interfacial compositions. We conclude that thermal annealing before Al deposition inhibits the migration of PEG to the organic/metal interface in the P3HT:PCBM:PEG system, while annealing after the Al deposition enhances it. Thus, our study reveals that there is a great significance in the sequence of which the thermal annealing and the cathode deposition are performed in additive-containing organic blends, on the interlayer formation, and as a result, on the device performance.

Paper Details

Date Published: 18 September 2015
PDF: 8 pages
Proc. SPIE 9567, Organic Photovoltaics XVI, 95670X (18 September 2015); doi: 10.1117/12.2189895
Show Author Affiliations
J. Vinokur, Technion-Israel Institute of Technology (Israel)
I. Deckman, Technion-Israel Institute of Technology (Israel)
S. Obuchovsky, Technion-Israel Institute of Technology (Israel)
K. Weinfeld, Technion-Israel Institute of Technology (Israel)
G. L. Frey, Technion-Israel Institute of Technology (Israel)

Published in SPIE Proceedings Vol. 9567:
Organic Photovoltaics XVI
Zakya H. Kafafi; Paul A. Lane; Ifor D. W. Samuel, Editor(s)

© SPIE. Terms of Use
Back to Top