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Proceedings Paper

Performance analysis of a full-field and full-range swept-source OCT system
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Paper Abstract

In recent years, optical coherence tomography (OCT) became gained importance in medical disciplines like ophthalmology, due to its noninvasive optical imaging technique with micrometer resolution and short measurement time. It enables e. g. the measurement and visualization of the depth structure of the retina. In other medical disciplines like dermatology, histopathological analysis is still the gold standard for skin cancer diagnosis. The EU-funded project VIAMOS (Vertically Integrated Array-type Mirau-based OCT System) proposes a new type of OCT system combined with micro-technologies to provide a hand-held, low-cost and miniaturized OCT system. The concept is a combination of full-field and full-range swept-source OCT (SS-OCT) detection in a multi-channel sensor based on a micro-optical Mirau-interferometer array, which is fabricated by means of wafer fabrication. This paper presents the study of an experimental proof-of-concept OCT system as a one-channel sensor with bulk optics. This sensor is a Linnik-interferometer type with similar optical parameters as the Mirau-interferometer array. A commercial wavelength tunable light source with a center wavelength at 845nm and 50nm spectral bandwidth is used with a camera for parallel OCT A-Scan detection. In addition, the reference microscope objective lens of the Linnik-interferometer is mounted on a piezo-actuated phase-shifter. Phase-shifting interferometry (PSI) techniques are applied for resolving the conjugate complex artifact and consequently contribute to an increase of image quality and depth range. A suppression ratio of the complex conjugate term of 36 dB is shown and a system sensitivity greater than 96 dB could be measured.

Paper Details

Date Published: 1 September 2015
PDF: 8 pages
Proc. SPIE 9576, Applied Advanced Optical Metrology Solutions, 957609 (1 September 2015); doi: 10.1117/12.2189885
Show Author Affiliations
J. Krauter, Institut für Technische Optik (Germany)
T. Boettcher, Institut für Technische Optik (Germany)
K. Körner, Institut für Technische Optik (Germany)
M. Gronle, Institut für Technische Optik (Germany)
W. Osten, Institut für Technische Optik (Germany)
N. Passilly, FEMTO-ST (France)
L. Froehly, FEMTO-ST (France)
S. Perrin, FEMTO-ST (France)
C. Gorecki, FEMTO-ST (France)

Published in SPIE Proceedings Vol. 9576:
Applied Advanced Optical Metrology Solutions
Erik Novak; James D. Trolinger, Editor(s)

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