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Proceedings Paper

Deposition and characterizations of ultrasmooth silver thin films assisted with a germanium wetting layer
Author(s): Junce Zhang; David M. Fryauf; Juan J. Diaz Leon; Matthew Garrett; Logeeswaran VJ; Saif M. Islam; Nobuhiko P. Kobayashi
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Paper Abstract

In this paper, silver thin films deposited on SiO2 substrates with a germanium wetting layer fabricated by electron-beam evaporation were studied. The characterization methods of XTEM, FTIR, XRD and XRR were used to study the structural properties of silver thin films with various thicknesses of germanium layers. Silver films deposited with very thin (1-5nm) germanium wetting layers show about one half of improvement in the crystallite sizes comparing silver films without germanium layer. The surface roughness of silver thin films significantly decrease with a thin germanium wetting layer, reaching a roughness minimum around 1-5nm of germanium, but as the germanium layer thickness increases, the silver thin film surface roughness increases. The relatively higher surface energy of germanium and bond dissociation energy of silver-germanium were introduced to explain the effects the germanium layer made to the silver film deposition. However, due to the Stranski-Krastanov growth mode of germanium layer, germanium island formation started with increased thickness (5-15nm), which leads to a rougher surface of silver films. The demonstrated silver thin films are very promising for large-scale applications as molecular anchors, optical metamaterials, plasmonic devices, and several areas of nanophotonics.

Paper Details

Date Published: 9 September 2015
PDF: 8 pages
Proc. SPIE 9553, Low-Dimensional Materials and Devices, 955314 (9 September 2015); doi: 10.1117/12.2189857
Show Author Affiliations
Junce Zhang, Univ. of California, Santa Cruz (United States)
NASA Ames Research Ctr. (United States)
David M. Fryauf, Univ. of California, Santa Cruz (United States)
NASA Ames Research Ctr. (United States)
Juan J. Diaz Leon, Univ. of California, Santa Cruz (United States)
NASA Ames Research Ctr. (United States)
Matthew Garrett, Univ. of California, Santa Cruz (United States)
NASA Ames Research Ctr. (United States)
Logeeswaran VJ, Univ. of California, Davis (United States)
Saif M. Islam, Univ. of California, Davis (United States)
Nobuhiko P. Kobayashi, Univ. of California, Santa Cruz (United States)
NASA Ames Research Ctr. (United States)


Published in SPIE Proceedings Vol. 9553:
Low-Dimensional Materials and Devices
Nobuhiko P. Kobayashi; A. Alec Talin; M. Saif Islam; Albert V. Davydov, Editor(s)

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