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Proceedings Paper

Lifetime evaluation of large format CMOS mixed signal infrared devices
Author(s): A. Linder; Eddie Glines
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Paper Abstract

New large scale foundry processes continue to produce reliable products. These new large scale devices continue to use industry best practice to screen for failure mechanisms and validate their long lifetime. The Failure-in-Time analysis in conjunction with foundry qualification information can be used to evaluate large format device lifetimes. This analysis is a helpful tool when zero failure life tests are typical. The reliability of the device is estimated by applying the failure rate to the use conditions. JEDEC publications continue to be the industry accepted methods.

Paper Details

Date Published: 1 September 2015
PDF: 8 pages
Proc. SPIE 9608, Infrared Remote Sensing and Instrumentation XXIII, 96080Y (1 September 2015); doi: 10.1117/12.2189358
Show Author Affiliations
A. Linder, Raytheon Vision Systems (United States)
Eddie Glines, On Semiconductor (United States)

Published in SPIE Proceedings Vol. 9608:
Infrared Remote Sensing and Instrumentation XXIII
Marija Strojnik Scholl; Gonzalo Páez, Editor(s)

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